tof-smis
surfaceseer is a compact, affordable, tof-sims designed for ease of use and speed of data acquisition. all the spectrometer tuning has been pre-set in the electronics, so that the surface chemistry of insulating, metals and semiconductor samples can be determined quickly and efficiently.
contact: nick.zhang
phone: 13916855175
tel: 021-56035615
email: [email protected]
add: suite902,no.3,magnolia green square,lane251,songhuajiang road,shanghai,china,200093