tof-吉祥棋牌官方正版

tof-smis

surfaceseer is a compact, affordable, tof-sims designed for ease of use and speed of data acquisition. all the spectrometer tuning has been pre-set in the electronics, so that the surface chemistry of insulating, metals and semiconductor samples can be determined quickly and efficiently.

• very high surface sensitivity (1x10⁹ atoms/cm² )
• very simple to use (1/2 day training)
• conducting and insulating surfaces
• positive and negative sims
• >2500 m/δm using time-of-flight reflectron mass analyser
• mass range >1000m/z
• mass accuracy of ± 5mamu.
• analysis area ~75um to 500um
• elemental and molecular information
• separates common organics from elements
• isotopic analysis
• sputter cleaning capability
• 5 minute sample pump down from atmosphere
• 1 minute analysis
• affordable
• expandable
• data libraries available